IC with test structures embedded within a contiguous standard cell area
An IC includes a contiguous standard cell area with first, second, and third TS-GATE-short-configured test area geometries disposed therein. In some embodiments, the contiguous standard cell area may further include: fourth and fifth TS-GATE-short-configured test area geometries, and/or other test area geometries, such as tip-to-tip-short, tip-to-side-short, diagonal-short, corner-short, interlayer-overlap-short, via-chamfer-short, merged-via-short, snake-open, stitch-open, via-open, or metal-island-open.
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Stephen Marci Kimon Kelvin Carl Indranil Simone Andrzej Timothy Sherry John Jonathan Marcin Jeremy Markus Larg Sheng-Che Rakesh Nobuharu Tomasz Hideki Dennis Conor Christopher Vyacheslav Hans
Lam Liao Michaels Doong Taylor De Comensoli Strojwas Fiscus Lee Kibarian Haigh Strojwas Cheng Rauscher Weiland Lin Vallishayee Yokoyama Brozek Matsuhashi Ciplickas O'Sullivan Hess Rovner Eisenmann