Systems and methods for self-testing of integrated devices during production
Embodiments of the present disclosure provide a method that includes producing an integrated circuit device configured to include a system on a chip (SOC) and accessing test code within the SOC during the producing. The method further includes self-testing the integrated circuit device with the test code.
Marvell International Ltd.
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G11C G01R G01R
inventional inventional inventional
Hungchi
Chen