Lee IP Law, P.C.
Probe card test apparatus
A probe card test apparatus including an insulating substrate; a conductive pattern on the insulating substrate; and a plurality of device under test (DUT) units on the conductive pattern, wherein each of the DUT units includes a merged-probe opening, a probe opening, and a detector in parallel, and an isolator surrounding the merged-probe opening, the probe opening, and the detector.
SAMSUNG ELECTRONICS CO., LTD.
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Taejun Jinwoo Joonsu Serim
Kim Jung Ji Lee