Myers Bigel Sibley & Sajovec
Circuits and methods for testing logic devices by modulating a test voltage with a noise signal
 Noise is introduced into test inputs and voltage supplies provided to logic devices while under going testing by modulating a test voltage output with a noise signal to produce the test input. In particular, a noise signal and a test voltage output are generated. The test voltage output is modulated with the noise signal to provide a test input to the logic device. A more accurate approximation of an actual operating environment is thereby provided. 
Samsung Electronics, Co., Ltd.
G
G01R
inventional
Hyun-deok Yun-ki Ki-hun Sung-jun
Park Kim Jung Yun