Muramatsu & Associates
Comparator for semiconductor testing device
 A comparator circuit for differential output signals which is not affected by a common mode noise on the differential signals. The comparator circuit is advantageously used for testing differential output signals from a device under test (DUT). The comparator circuit includes an offset circuit for receiving differential signals from the DUT and generating a pair of balanced output signals which is provided with a predetermined offset voltage therebetween, and a comparator for receiving the pair of output signals from the offset circuit and comparing voltages between the output signals. 
Advantest Corp.
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Kenji
Yoshida