F. Chau & Associates, LLC
Stress detection circuit and semiconductor chip including same
A stress detection circuit includes a function block and a detection signal generation circuit. The function block outputs a first voltage such that the first voltage is varied depending on an extent that the function block is stressed. The detection signal generation circuit generates a stress detection signal based on the first voltage and a second voltage during a test mode. The stress detection signal represents integration of the function block, and a level of the second voltage corresponds to a level of the first voltage before the function block is stressed.
Samsung Electronics Co., Ltd.
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G11C G01R G01R G01R G11C
inventional additional inventional additional inventional
Young-Chan Yun-Sang Jung-Bae
Jang Lee Lee