Harness, Dickey & Pierce, P.L.C.
Tester and semiconductor device test apparatus having the same
Provided are a tester and a semiconductor device test apparatus having the tester. The tester includes a tested head configured to transfer electronic signals to a probe card. The tester also includes a leveling unit is provided on the tester head. The leveling unit is configured to apply a load to the probe card to maintain a level state of the probe card.
Samsung Electronics Co., Ltd.
G
G01R
inventional
Jung-Woo Byoungjoo Inseok
Kim Kim Hwang