Merchant & Gould P.C.
Systems and methods for determining systematic defects
Methods and systems for determining a systematic defect in a circuit under test is provided. Elements of the circuit under test converted into scan cells. A first scan chain that includes a first plurality of scan cells is formed. Each scan cell of the first plurality of scan cells of the first scan chain are of a first cell type. The first scan chain contains a first scan input and a first scan output. A first test pattern is applied at the scan input and a first test output is collected for the applied first test pattern at the first scan output. The collected first test output is compared with a first expected test output. The first cell type is marked to be a suspect for a systematic defect when the first test output is different from the first expected test output.
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
G G G G G
G11C G01R G11C G01R G01R
inventional inventional inventional inventional additional
Sandeep Kumar Ankita Yun-Han
Goel Patidar Lee