Tarolli, Sundheim, Covell & Tummino LLP
Apparatus and method for measuring nonlinear parameters
The present invention relates to a technology for measuring a nonlinear parameter of an object to be measured, and more particularly, to an apparatus and method for measuring a nonlinear parameter of an object to be measured.
Korea Research Institute of Standards and Science
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Young Min Seung Hyun Choon Su Dae Cheol Seung Seok
Seong Cho Park Seo Lee