Hodgson Russ LLP
Device and method for detecting defect contour with omnidirectionally equal sensitivity based on magnetic excitation
A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.
TSINGHUA UNIVERSITY
G H G G H G
G01N H01F G01N G01R H01F G01R
inventional additional inventional inventional additional inventional
Zijing Wei Shen Lisha Songling Wenzhi
Huang Zhao Wang Peng Huang Wang