Jianq Chyun IP Office
Yield evaluating apparatus and method thereof
A yield evaluating apparatus and a method thereof are provided. The yield evaluating apparatus includes a spatial correlation module. The spatial correlation module receives at least one process-related data and a plurality of circuit layouts and obtains a correlation coefficient between unit elements in the circuit layouts according to the process-related data. The spatial correlation module calculates a spatial correlation between elements in each of the circuit layouts according to the correlation coefficient and selects one of the circuit layouts according to the spatial correlations.
Industrial Technology Research Institute National Central University
G G
G06F G06F
additional inventional
Ji-Jan Wen-Ching Liang-Chia Pei-Wen Chin-Long Jwu-E
Chen Wu Cheng Luo Wey Chen