J.C. Patents
Test apparatus, test vector generate unit, test method, program, and recording medium
Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a vector selecting section that selects test vectors that cause a prescribed characteristic of the device under test, which is to be measured when test signals that are each based on one of the test vectors are supplied to the device under test, to fulfill a preset condition; and a judging section that judges pass/fail of the device under test based on measured values of the prescribed characteristic of the device under test supplied with the test signal based on the test vectors selected by the vector selecting section.
The University Of Tokyo Advantest Corporation
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G01R G01R G01R
inventional inventional inventional
Gorschwin Yasuo Satoshi Masahiro
Fey Furukawa Komatsu Fujita