Hermetic metallized via with improved reliability
An article includes a glass or glass-ceramic substrate having a first major surface and a second major surface opposite the first major surface, and at least one via extending through the substrate from the first major surface to the second major surface over an axial length in an axial dimension. The article also includes a metal connector disposed within the via that hermetically seals the via. The article has a helium hermeticity of less than or equal to 1.0×10−8 atm-cc/s after 1000 thermal shock cycles, each of the thermal shock cycle comprises cooling the article to a temperature of −40° C. and heating the article to a temperature of 125° C., and the article has a helium hermeticity of less than or equal to 1.0×10−8 atm-cc/s after 100 hours of HAST at a temperature of 130° C. and a relative humidity of 85%.
Corning Incorporated
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Rajesh Chad Byron Mandakini Scott Christopher Prantik Tian Ah-Young Ekaterina Aleksandrovna Chukwudi Azubuike
Vaddi Moore Kanungo Pollard Mazumder Huang Park Kuksenkova Okoro