Patterson Thuente Pedersen, P.A.
Scanning probe microscopy utilizing separable components
According to embodiments, a cantilever probe for use with an atomic force microscope (AFM) or scanning probe microscope (SPM) has a pad of conformable material that facilitates non-permanent adhesion through van der Waals interactions. Such removable probes and probe tips facilitate use of multiple tips or probes, while reducing the need for recalibration or repositioning.
Bruker Nano, Inc.
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inventional inventional additional inventional inventional
Weijie Chanmin Izhar
Wang Su Medalsy