Silicon Valley Patent Group LLP
Measure of analysis performed in property checking
The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicated that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.
Mentor Graphics Corporation
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inventional inventional inventional
Kalyana C. Ping Fai Ramesh Christophe Chian-Min Richard Jeremy Rutledge
Mulam Yeung Sathianathan Gauthron Ho Levitt