Westman, Champlin & Koehler, P.A.
Methods and apparatuses for measuring effective atomic number of an object
Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.
Nuctech Company Limited Tsinghua University
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additional additional inventional inventional
Yinong Wenjian Shuqing Yi Ziran Qingjun Zhiqiang Yuanjing Weibin Shuwei
Liu Zhang Zhao Wang Zhao Zhang Chen Li Zhu Li