Sterne, Kessler, Goldstein & Fox P.L.L.C.
Machine-learning based scan design enablement platform
Electronic design automation (EDA) of the present disclosure, in various embodiments, optimizes designing, simulating, analyzing, and verifying of electronic circuitry for an electronic device. The electronic device includes scan flip-flops to autonomously test the electronic circuitry for various manufacturing faults. The EDA of the present disclosure statistically groups the scan flip-flops into scan chains in such a manner such that scan flip-flops within each scan chain share similar characteristics, parameters, or attributes. Thereafter, the EDA of the present disclosure intelligently arranges ordering for the scan flip-flops within each of the scan chains to optimize power, performance, and/or area of the electronic circuitry.
Taiwan Semiconductor Manufacturing Co., Ltd.
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Sandeep Kumar Vinay Ankita Yun-Han
Goel Kotha Patidar Lee