Knobbe, Martens, Olson & Bear
Semiconductor test equipment
 A semiconductor test equipment for testing a semiconductor device which is capable of reducing the cost and size is disclosed. The semiconductor test equipment includes a main clock generator for generating a main clock signal having the highest frequency, a first pattern generator which receives the main clock signal for generating a first test pattern signal, a clock divider which divides the main clock signal to generate a lower frequency clock signal, and a second pattern generator which receives the lower frequency clock for generating a second test pattern. The semiconductor test equipment further includes a first wave formatter which receives the first pattern signal for forming a predetermined wave shape, and a second wave formatter which receives the second pattern signal for forming a predetermined wave shape, a first comparator circuit which receives a first output signal from the device under test and compares the first output signal with a first expected pattern from the first pattern generator, and a second comparator circuit which receives a second output signal from the device under test and compares the second output signal with a second expected pattern from the second pattern generator. 
Advantest Corporation
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Masao Kenji
Shimizu Yoshida