Holland & Hart, LLP
System and method for frequency offset testing
Described is a system and method for frequency offset testing. The system comprises an electronic device, a first testing device providing a reference clock signal at a first frequency to the electronic device, and a second testing device receiving data from the electronic device at the first frequency and transmitting data to the electronic device at a second frequency. The second frequency is equal to a product of the first frequency and a frequency offset value.
Verigy (Singapore) Pte. Ltd.
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Jinlei
Liu