Hauptman Ham, LLP
System for and method of semiconductor fault detection
A method of detecting one or more faults in a semiconductor device that includes generating a first test pattern set from a primary node list and a fault list. The primary node list includes one or more nodes and the fault list identifies one or more faults. The method also includes generating one or more secondary node lists from the primary node list and generating a second test pattern set from at least the first test pattern set and the secondary node list. Each node of the one or more nodes of the primary node list is associated with a corresponding secondary node list of the one or more secondary node lists.
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD
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G06F G01R G06F
additional inventional inventional
Sandeep Kumar Yuan-Han
Goel Lee