Mattingly & Malur, PC
Charged particle beam apparatus and geometrical aberration measurement method therefor
Disclosed is a scanning charged particle microscope provided with an aberration measuring means that measures high-order geometrical aberration at high precision and high speed. An image obtained by a single-hole aperture and an image obtained by a multiple-hole aperture arranged in a region larger than that for the single-hole aperture are deconvoluted, an aberration quantity is determined based on the profiles of beams tilted in a plurality of directions and the obtained quantity is fed back to an aberration corrector.
Hitachi High-Technologies Corporation
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H01J H01J H01J H01J
inventional inventional inventional additional
Takeshi Tomonori Kotoko Hiroyuki
Kawasaki Nakano Hirose Ito