F. Chau & Associates, LLC
Test socket for testing electrical characteristics of a memory module
A test socket may include a socket frame, a plate, a socket pin and a link. The socket frame may have a slot configured to accept an object. The plate may be free to move in the slot along an inserting direction of the object to support a lower surface of the object. The socket pin may be movably arranged in a direction substantially perpendicular to the inserting direction of the object. The socket pin may selectively make contact with a tab of the object. A link may be pivotally connected to the socket pin and the plate. Thus, the socket pin of the test socket may avoid dragging along the tab of the object during insertion, and accordingly, the tab of the object may avoid damage.
Samsung Electronics Co., Ltd.
H G H
H01R G01R H01R
additional additional inventional
Kwang-Su Jae-Seon Jung-Hoon Seong-Chan Yong-Hyun
Yu Hwang Kim Han Kim