WPAT, PC
Chip testing apparatus and testing method thereof
A chip testing apparatus and a chip testing method are provided. The chip testing apparatus includes a command generating module, a transceiving module and a control module. When the command generating module generates a first test command, the transceiving module transmits the first test command to a radio frequency identification (RFID) chip and receives a target test result from the RFID chip. The control module determines whether the target test result complies with a reference test result. When the determination result of the control module is no, the control module controls the command generating module to generate a second test command for retesting the RFID chip.
Mstar Semiconductor, Inc.
G G
G01R G06K
additional inventional
Chih Yen Chih Hua
Chang Huang