MKG, LLC
MOSFET and a method for manufacturing the same
A method of manufacturing a MOSFET is presented. The method includes forming the MOSFET wherein a source region and a drain region are unsymmetrical in structure, with the horizontal junction depth of the drain region greater than the source region, and the vertical junction depth of the drain region greater than the source region; the breakdown voltage of the device is raised by increasing the horizontal and vertical junction depths of the drain region, and the horizontal dimension of the device is diminished by reducing the horizontal and vertical junction depths of the source region. In one embodiment, the formed MOSFET includes a gate dielectric layer that is unsymmetrical in structure—and the GIDL effect in the device is reduced by increasing the thickness of the first gate dielectric section, and the driving current of the device is increased by reducing the thickness of the second gate dielectric section.
Shanghai Huahong Grace Semiconductor Manufacturing Corporation
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Yu
Chen