F. Chau & Associates, LLC
Method of detecting a pixel defect
A method of detecting a pixel defect for detecting a defect of a pixel including first to fourth transistors, connected to a data line, and receiving a scan signal and an initialization control signal includes turning on the first through fourth transistors by changing the scan signal and the initialization control signal to have a turn-on voltage level in an inspection period, detecting an inspecting current flowing in a path corresponding to the first through fourth transistors using a current detector that is connected to the data line, determining that a threshold voltage of the second transistor is within a normal range when the inspecting current is within a reference range, and determining that the threshold voltage of the second transistor is out of the normal range when the inspecting current is out of the reference range.
SAMSUNG DISPLAY CO., LTD.
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Yongbin Hyun Young Gunwoo
Kim Choi Yang