IC with test structures and E-beam pads embedded within a contiguous standard cell area
An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.
PDF Solutions, Inc.
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Carl Markus Conor Timothy Kimon Indranil Jonathan Hideki Rakesh Marcin Christopher Simone Jeremy Kelvin Sherry Stephen Matthew Dennis Andrzej Hans Larg Vyacheslav John Tomasz Sheng-Che Nobuharu Marci
Taylor Rauscher O'Sullivan Fiscus Michaels De Haigh Matsuhashi Vallishayee Strojwas Hess Comensoli Cheng Doong Lee Lam Moe Ciplickas Strojwas Eisenmann Weiland Rovner Kibarian Brozek Lin Yokoyama Liao