Saile Ackerman LLC
Method to form a current confining path of a CPP GMR device
Concerns about inadequate electromigration robustness in CCP CPP GMR devices have been overcome by adding magnesium to the current confining structures that are presently in use. In one embodiment the alumina layer, in which the current carrying copper regions are embedded, is fully replaced by a magnesia layer. In other embodiments, alumina is still used but a layer of magnesium is included within the structure before it is subjected to ion assisted oxidation.
Headway Technologies, Inc.
B Y Y H Y G Y G G H
B82Y Y10T Y10T H01L Y10T G01R Y10T G11B G11B H01L
inventional additional additional inventional additional inventional additional inventional inventional inventional
Yu-Hsia Min Daniel G Kunliang
Chen Li Abels Zhang