Muncy, Geissler, Olds & Lowe, P.C.
Method for characterizing resistance state of programmable element
The present application discloses a method for characterizing a resistance state of a programmable element of an integrated circuit. The method includes the steps of setting a first programming voltage of a first polarity to program the programmable element of the integrated circuit, setting a first read voltage of the first polarity to the integrated circuit at a first temperature to obtain a first read current, and a first resistance is derived from the first read current, setting the first read voltage of the first polarity to the integrated circuit at a second temperature to obtain a second read current, the second temperature is at least 50° C. higher than the first temperature, and a second resistance is derived from the second read current, and comparing the first resistance and the second resistance to characterize the resistance state of the programmable element.
NANYA TECHNOLOGY CORPORATION
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Hsih-Yang Ting-Cih Wei-Zhong
Chiu Kang Li