Nath, Goldberg & Meyer
Display panel test structure
The present application discloses a display panel test structure for testing whether signal lines of a display panel are defective, the signal lines at least comprising a plurality of data lines which are divided into N groups, the display panel test structure comprising N first shorting bars arranged in a test area of the display panel, each of which being configured to short-circuit a group of data lines, wherein the display panel test structure further comprises a plurality of first test pads arranged in the test area, each of which connects with one shorting bar corresponding thereto, and each of the first test pads is configured to load a signal to a group of data lines corresponding thereto during a test.
BOE TECHNOLOGY GROUP CO., LTD. BEIJING BOE DISPLAY TECHNOLOGY CO., LTD.
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inventional inventional inventional additional inventional additional
Mian Namin Minghui Yanyan Bin Fengwu Long Jinhu Wei
Gao Kwon Ma Wu Cao Yu Guo Cao Li