Jefferson IP Law, LLP
Method and apparatus for measuring performance of electronic device
A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.
Samsung Electronics Co., Ltd.
H G G G
H04M G01R G01R G01R
additional inventional inventional inventional
Byeonghwan Keonyoung Jungmin Bonghee Kwangmo
Kang Seo Kim Park Yang