Haynes and Boone, LLP
Method for forming source/drain contacts utilizing an inhibitor
A method includes providing a structure having a substrate, a gate, a gate spacer, a dielectric gate cap, a source/drain (S/D) feature, a contact etch stop layer (CESL) covering a sidewall of the gate spacer and a top surface of the S/D feature, and an inter-level dielectric (ILD) layer. The method includes etching a contact hole through the ILD layer and through a portion of the CESL, the contact hole exposing the CESL covering the sidewalls of the gate spacer and exposing a top portion of the S/D feature. The method includes forming a silicide feature on the S/D feature and selectively depositing an inhibitor on the silicide feature. The inhibitor is not deposited on surfaces of the CESL other than at a corner area where the CESL and the silicide feature meet.
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
H H H H H H H H H H H H
H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L
inventional inventional inventional inventional additional inventional inventional inventional inventional inventional additional inventional
Cheng-Chi Yu-Ming Chih-Hao Lin-Yu Li-Zhen Chia-Hao
Chuang Lin Wang Huang Yu Chang