Volentine & Whitt, PLLC
Semiconductor device testing memory cells and test method
Disclosed are a semiconductor device capable of testing memory cells and a test method. The semiconductor device includes a plurality of terminals, each terminal being configured to receive similar data during a test mode, a plurality of buffers, each buffer being configured to receive data from a corresponding terminal and output either the data or changed data to a corresponding memory cells in response to a control signal, and a control unit configured to generate a plurality of control signals, each control signal being respectively applied to a corresponding buffer.
Samsung Electronics Co., Ltd.
G G G
G11C G11C G11C
inventional additional inventional
Kwun-soo Joung-wook Jung-sik
Cheon Moon Kim