Miles & Stockbridge, P.C.
Charged particle beam device with transient signal correction during beam blanking
A charged particle apparatus including a charged particle source unit; a blanking electrode unit that blanks a charged particle beam launched from the charged particle source unit; a deflecting electrode unit that deflects the charged particle beam; an objective lens unit that converges the charged particle beam deflected by the deflecting electrode unit and radiates the charged particle beam to a surface of a sample; a secondary charged particle detection unit that detects a secondary charged particle generated from the sample; a signal processing unit that processes a signal obtained by detecting the secondary charged particle; and a control unit that corrects a transient signal when the blanking of the charged particle beam is turned off by the blanking electrode, such that an image with no distortion can be obtained even when the blanking electrode is operated to turn on and off at a high speed.
HITACHI HIGH-TECHNOLOGIES CORPORATION
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Hiroyuki Ryo Hajime Kazuki Wen
Takahashi Kadoi Kawano Ikeda Li