Muir Patent Law, PLLC
Memory device to correct defect cell generated after packaging
A memory device to correct a defect cell generated after packing is performed includes a memory cell array in which a plurality of memory cells are arranged, a repair circuit unit including a first storage unit to store defect cell information in the memory cell array, and a fuse circuit unit including a second storage unit that is programmed according to the defect cell information stored in the first storage unit. The first storage unit includes a volatile memory device, and the second storage unit includes a non-volatile memory device.
SAMSUNG ELECTRONICS CO., LTD.
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Jung-sik Cheol Sang-ho
Kim Kim Shin