Muirhead and Saturnelli, LLC
Ion detection and parameter estimation for N-dimensional data
Methods and apparatus for LC/IMS/MS analysis involve obtaining noisy raw data from a sample, convolving the data with an artifact-reducing filter, and locating, in retention-time, ion mobility, and mass-to-charge-ratio dimensions, one or more ion peaks of the convolved data.
Waters Technologies Corporation
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G06K H01J H01J G16C H01J G16C G06K
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Marc V. Guo-Zhong
Gorenstein Li