Sughrue Mion, PLLC
Large-scale integrated circuit and method for testing a board of same
In a large-scale integrated circuit, a scan path is divided between an I/O scan path that is formed by a series connection between only flip-flops that are in a region near an I/O pin and an internal scan path that is formed by a series connection between other flip-flops. A selector has one of its inputs connected to another end of the I/O scan path and to one end of the internal scan path, another of its inputs connected to another end of the internal scan path, and its output connected to a scan out. This selector, based on a test mode signal, selects either all scan paths or only the I/O scan path.
NEC Corporation
G G
G01R G01R
inventional inventional
Hiroo Hajime
Ito Matsuzawa