Eschweiler & Potashnik, LLC
One-time-programmable (OTP) implementation using magnetic junctions
Various embodiments of the present application are directed towards a one-time-programmable (OTP) implementation using magnetic junctions. In some embodiments, an array comprises multiple magnetic junctions in multiple columns and multiple rows, and the magnetic junctions comprise a first magnetic junction and a second magnetic junction. The first and second magnetic junctions comprise individual top ferromagnetic elements and individual bottom ferromagnetic elements, and further comprise individual barrier elements between the top and bottom ferromagnetic elements. A first barrier element of the first magnetic junction electrically separates first top and bottom ferromagnetic elements of the first magnetic junction. A second barrier element of the second magnetic junction has undergone breakdown, such that it has defects defining a leakage path between second top and bottom ferromagnetic elements of the second magnetic junction. The broken-down state corresponds to a one-time programmed state and is not susceptible to high-temperature change, even at small sizes.
Taiwan Semiconductor Manufacturing Co., Ltd.
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Harry-Hak-Lay Yi-Chieh Yu-Lin Wen-Chun Chang-Hung Jian-Cheng Tien-Wei
Chuang Chiu Chen You Chen Huang Chiang