Slater & Matsil, L.L.P.
Test schemes and apparatus for passive interposers
A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern.
Taiwan Semiconductor Manufacturing Company, Ltd.
G
G01R
inventional
Tan-Li Mill-Jer Yun-Han
Chou Wang Lee