Marger Johnson & McCollom, P.C.
Method and apparatus for controlling a high voltage generator in a wafer burn-in test
The invention relates to a method and apparatus for controlling a high voltage generator during wafer burn-in. The method includes generating an enable signal for enabling a high voltage generator responsive to a mode signal, e.g., a wafer burn-in test mode. The method provides an external voltage to a semiconductor memory device through a pad responsive to the enable signal. The method varies a high voltage level being output from the high voltage generator in response to a reference voltage level.
Samsung Electronics Co., Ltd.
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Jong-Hyun Choong-Sun Yong-Hwan Hyung-Dong Sang-Seok
Choi Park Jung Kim Kang