IC with test structures and e-beam pads embedded within a contiguous standard cell area
An IC that includes a contiguous standard cell area with a 4x3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.
PDF Solutions, Inc.
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Jonathan John Dennis Conor Vyacheslav Stephen Hideki Carl Sherry Sheng-Che Marci Timothy Christopher Andrzej Rakesh Jeremy Larg Nobuharu Markus Matthew Marcin Hans Kimon Kelvin Indranil Tomasz Simone
Haigh Kibarian Ciplickas O'Sullivan Rovner Lam Matsuhashi Taylor Lee Lin Liao Fiscus Hess Strojwas Vallishayee Cheng Weiland Yokoyama Rauscher Moe Strojwas Eisenmann Michaels Doong De Brozek Comensoli