Muncy, Geissler, Olds & Lowe, P.C.
Sensing multiple peak wavelengths using combination of dual-band filters
A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.
VISERA TECHNOLOGIES COMPANY LIMITED
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Wei-Ko Yu-Jen
Wang Chen