William Park & Associates Ltd.
Memory device and operating method to determine a defective memory block
Provided herein is a memory device and a method of operating the memory device. The memory device may include a one or more memory blocks, one or more peripheral circuits configured to perform an erase operation and a threshold voltage distribution scan operation on a selected memory block, and a control logic configured to control the one or more peripheral circuits, and determine the selected memory block to be a normal memory block or a defective memory block based on a result of the threshold voltage distribution scan operation.
SK hynix Inc.
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Min Ho Youn Ho Jeong Hoon Dong Hyun Seung Ju
Her Jung Park Kim Ha