Methods, apparatus and articles of manufacture for testing a plurality of singulated die
In one embodiment, a method for testing a plurality of singulated semiconductor die involves 1) placing each of the singulated semiconductor die on a surface of a die carrier, 2) mating an array of electrical contactors with the plurality of singulated semiconductor die, and then 3) performing electrical tests on the plurality of singulated semiconductor die, via the array of electrical contactors.
Advantest (Singapore) Pte Ltd
G H
G01R H01L
inventional inventional
Alan D. Kenneth D. James C.
Hart Karklin Anderson