Locke Lord LLP
Method and system of close-loop analysis to electronic component fault problem
Method and system for performing close-loop analysis to electronic component failures are provided. The system establishes an electronic component fault tree of physics of failure (FTPF), converts the FTPF into a failure locating fault tree, establishes an electronic component fault dictionary with the cause of failure mechanism corresponding to failure characteristics, and performs close-loop analysis to the electronic component according to the fault tree and the fault dictionary. According to the disclosure, it is possible to locate the electronic component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the electronic component failure mode by analyzing the failure characteristic vector in the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the FTPF, thereby achieving fast and accurate locating and diagnosis for the electronic component failure.
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY
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G06F G06F G05B G05B G06F G01M G05B
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Yunhui Yunfei Yuan Ping Xiaoqi
Wang En Chen Lai He