Hamilton DeSanctis & Cha
Systems and methods for storage channel testing
Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.
LSI Corporation
G G
G11B G11B
inventional additional
Yuan Xing Weijun Shaohua George Hao Hongwei
Lee Tan Yang Mathew Zhong Song