K & L Gates LLP
Electrical fuse self test and repair
A circuit for testing and repairing a fuse device having a plurality of fuse units and being able to serially input and output data is disclosed, the circuit comprises a first multiplexer configured to select either a true or an inverted data for being stored in the fuse device, a second multiplexer configured to select either a true or an inverted data being read out from the fuse device, a storage unit configured to store information of faulty fuse units, and an indication bit being programmed to reflect a comparison between the data intended to be stored in the fuse device and the stored faulty unit information, wherein when the indication bit is at a first state, the first and second multiplexers select the true data, and when the indication bit is at a second state, the first and second multiplexers select the inverted data.
Taiwan Semiconductor Manufacturing Co., Ltd.
G G G
G11C G11C G11C
inventional inventional inventional
Chingwen
Chang