Mattingly & Malur, P.C.
Electric charged particle beam microscope and microscopy
An electric charged particle beam microscope is provided in which a specimen movement due to a specimen rotation is classified into a repeatable movement and a non-repeatable movement, a model of movement is determined for the repeatable movement, a range of movement is determined for the non-repeatable movement, the repeatable movement is corrected on the basis of the movement model through open-loop and the non-repeatable movement is corrected under a condition set on the basis of the range of movement.
Hitachi High-Technologies Corporation
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Takafumi Hideki Ruriko Toshie
Yotsuji Kikuchi Tsuneta Yaguchi