Park, Vaughan & Fleming, LLP
Method and apparatus for detecting and analyzing the propagation of noise through an integrated circuit
One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.
Synopsys, Inc.
G
G06F
inventional
Seyed Alireza William Chiu-Ting Jindrich Mahmoud Chi-Chong Wenyuan Alexander Peivand Yansheng
Kasnavi Shu Zejda Shahram Lo Wang Gyure Fallah-Tehrani Luo