Muir Patent Consulting, PLLC
Apparatus for measuring in-phase and quadrature (IQ) imbalance
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a signal generator can provide a first IQ signal of a DC component during a first period and the first IQ signal of a first angular frequency during a second period, an IQ up-conversion mixer can up-convert the first IQ signal by a second angular frequency during the first period and up-convert the first IQ signal by a third angular frequency during the second period to output a second IQ signal, an IQ down-conversion mixer can down-convert the second IQ signal by the third angular frequency to output a third IQ signal and an IQ imbalance detector can obtain a first IQ imbalance (e.g., Rx IQ imbalance) from the third IQ signal during the first period and a second IQ imbalance (e.g., Tx/Rx IQ imbalance) during the second period.
GCT Semiconductor, Inc.
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Seung-Wook Jeong Woo Joonbae Eal Wan Kyeongho
Lee Lee Park Lee Lee