Volentine & Whitt, PLLC
Transmission electron microscope specimen and method of manufacturing the same
A transmission electron microscope (TEM) specimen and a method of manufacturing the specimen are provided. The specimen comprises an analysis point. The specimen is formed by forming a dimple at a surface portion of the preliminary specimen, and ion milling the preliminary specimen having the dimple.
Samsung Electronics Co., Ltd.
G G
G01N G01N
inventional inventional
Jung-Sun Myoung-Rack
Kim Lee