Harness, Dickey & Pierce, P.L.C.
Semiconductor devices having on-die termination structures for reducing current consumption and termination methods performed in the semiconductor devices
Example embodiments disclose a semiconductor device having an on-die termination (ODT) structure that reduces current consumption, and a termination method performed in the semiconductor device. The semiconductor device includes a calibration circuit for generating calibration codes in response to a reference voltage and a voltage of a calibration terminal connected to an external resistor and an on-die termination device for controlling a termination resistance of a data input/output pad in response to the calibration codes and an on-die termination control signal. The termination resistance of the data input/output pad is greater than a resistance of the calibration terminal.
Samsung Electronics Co., Ltd.
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Jung-hwan Yang-ki Young
Choi Kim Choi