Foley & Lardner LLP
X-ray examination method and X-ray examination apparatus
An X-ray examination apparatus includes a scanning X-ray source for outputting X-rays, a sensor base which is attached with a plurality of X-ray sensors and which rotates about a rotation axis, and an image acquiring control mechanism for controlling rotation angle of the sensor base and acquisition of image data from the X-ray sensors. With respect to each X-ray sensor, the scanning X-ray source moves the X-ray focal position of the X-ray source to each starting position of the X-ray emission set so that the X-ray transmits through a predetermined examination area of an examination target and enters each X-ray sensor, and emits the X-rays. The image control acquiring control mechanism acquires image data detected by the X-ray sensors, and a calculation unit reconstructs an image of the examination area based on the image data.
Omron Corporation
H G
H01J G01N
inventional inventional
Noriyuki Masayuki Haruyuki Tsuyoshi
Kato Masuda Koizumi Matsunami