Volentine Francos, PLLC
Socket and printed circuit board for semiconductor device, and method of testing semiconductor device
A socket and a printed circuit board for testing a semiconductor device packaged by a chip scaled package (CSP) method, and a semiconductor device testing method are provided. In order to test the semiconductor device packaged by a CSP method, the upper wall of the testing socket has a socket aperture formed to expose the pads of the semiconductor device to be tested to the outside of the testing socket. The testing socket may be mounted under the printed circuit board. The printed circuit board has a board aperture formed over the socket aperture. The pads of a semiconductor device are directly probed through both the socket aperture and the board aperture, so that the waveforms of a semiconductor device can be measured.
Samsung Electronics Co., Ltd.
G
G01R
inventional
Jung-hwan
Choi