Hauptman Ham, LLP
Method and apparatus for capacitance extraction
A method comprises processing a layout of an integrated circuit to determine one or more attributes of one or more components of the integrated circuit. The method also comprises extracting one or more process parameters from a process file associated with manufacturing the integrated circuit. The one or more process parameters are extracted from the process file based on a computation of one or more logic functions included in the process file. The computation is based on the one or more attributes. The method further comprises calculating a capacitance value between at least two components of the integrated circuit based on the one or more process parameters and a capacitance determination rule included in the process file. At least one of the one or more process parameters, the one or more logic functions, or the capacitance determination rule is editable based on a user input.
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
G
G06F
inventional
Chih-Cheng Ke-ying Chung-Hsing Tsung-Han Hsien-Hsin Sean
Chou Su Wang Wu Lee