Advent, LLP
Dynamic trim method for non-volatile memory products
A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.
Maxim Integrated Products, Inc.
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Sean Che-Ping Yi Larry Albert Wei
Lynch Chen He Wang Bergemont Zhao