IC with test structures and E-beam pads embedded within a contiguous standard cell area
An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.
PDF Solutions, Inc.
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John Carl Rakesh Vyacheslav Sherry Markus Stephen Dennis Tomasz Marci Marcin Kelvin Jonathan Andrzej Simone Sheng-Che Kimon Timothy Hideki Christopher Jeremy Nobuharu Larg Hans Indranil Matthew Conor
Kibarian Taylor Vallishayee Rovner Lee Rauscher Lam Ciplickas Brozek Liao Strojwas Doong Haigh Strojwas Comensoli Lin Michaels Fiscus Matsuhashi Hess Cheng Yokoyama Weiland Eisenmann De Moe O'Sullivan