McClure, Qualey & Rodack, LLP
Method and device for predicting operation parameter of integrated circuit
A method for predicting an operation parameter of an integrated circuit includes the following steps. A plurality of cells used by the integrated circuit are provided. A voltage-frequency sweep test is performed on each of cells through a test model to generate a plurality of parameters, wherein the parameters correspond to a voltage value. A lookup table is established according to the parameters. A timing signoff corresponding to the integrated circuit is obtained. A timing analysis is performed on a plurality of timing paths of the integrated circuit according to the timing signoff and the parameters of the lookup table to obtain a critical timing path, and the operation parameter of the integrated circuit is predicted according to the critical timing path.
SHANGHAI ZHAOXIN SEMICONDUCTOR CO., LTD.
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Xiaojing Miao Yi
Li Liu Li