Muramatsu & Associates
Semiconductor test apparatus and performance board
A gain of a buffer provided on a performance board of a semiconductor test apparatus can be adjusted for testing image sensors with high accuracy. The performance board includes buffers for driving cables, and switches for inputting either a measurement signal from a device under measurement or a reference signal output from a reference signal generator. During calibration, the switches are turned to terminals to which the reference signal is input, such that the reference signal is applied to the buffers. Then, the gains of the buffers are corrected so that the output of an analog capture board has a desired value.
Advantest Corp.
G
G01R
inventional
Kenji
Yoshida