Ling and Yang Intellectual Property
Clock signal test circuit, control method thereof, display panel and test device
The present application discloses a clock signal test circuit, a control method thereof, a display panel and a test device. The clock signal test circuit comprises: N clock control signal lines; M control sub-circuits, each of which includes at least two control branches, wherein each of the control branches is configured to output a signal input from the input signal line to the corresponding output signal line under the control of a signal input from the corresponding clock control signal line; and a pull-down sub-circuit including N pull-down branches, wherein each of the pull-down branches is configured to output the first power supply voltage to the corresponding output signal line under the control of the signal input from the corresponding clock control signal line.
BOE Technology Group Co., Ltd.
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Yongqian
Li