Method and circuit for testing an analog-to-digital converter module on a data processing system having an intermodule bus
 A data processing system (20) includes a plurality of modules (44, 48) and an analog-to-digital converter (ADC) (46). The ADC (46) includes at least one port terminal (66) for transmitting test information from the ADC (46). The plurality of modules (44,48) and the ADC (46) are coupled to a central processing unit (CPU) (22) via an intermodule bus (42). A tester can exchange test information with the ADC (46) directly through the port terminal (66) instead of using the intermodule bus (42). Also, various sub-modules (62, 64, 60, 74) of the ADC (46) can be independently tested without performing a conversion process. 
Motorola, Inc.
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H03M H03M
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Scott Willard Jiang Jules D. Christian Robert S.
Herrin Chen Campbell, Jr. Ahrens Jones, III