Myers Bigel, P.A.
Test element group and semiconductor wafer including the same
A test element group includes a test element including a plurality of test transistors connected in series between a first node and a second node, the second node being connected to a ground node; a first transistor connected between the first node and a power supply node; and a second transistor configured to generate an output current, proportional to a voltage at the first node, and connected to the first node and the power supply node.
Samsung Electronics Co., Ltd.
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Sung Gun Hwa Sung Zhan Ju Hyun
Kang Rhee Zhan Kim