Rowan TELS LLC
Deep learning based identification of difficult to test nodes
Techniques to improve the accuracy and speed for detection and remediation of difficult to test nodes in a circuit design netlist. The techniques utilize improved netlist representations, test point insertion, and trained neural networks.
NVIDIA Corp.
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Harbinder Lijuan Sandeep Manjunatha Kaushik Karthikeyan
Sikka Luo Gangundi Gowda Narayanun Natarajan