Volentine & Whitt, PLLC
Method and system for testing semiconductor memory device using internal clock signal of semiconductor memory device as data strobe signal
Provided are a method and system for testing a semiconductor memory device using an internal clock signal of the semiconductor memory device as a data strobe signal. The internally-generated data strobe signal may be delayed to synchronize with test data. Because a test device need not supply the data strobe signal, the number of semiconductor memory modules that can be simultaneously tested can be increased, and an average test time for a unit memory module can be decreased.
Samsung Electronics Co., Ltd.
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Jun-bae Sung-man Jin-ho
Kim Park Ryu