McGinn IP Law Group, PLLC
Semiconductor device, internal circuit control signal measurement circuit, and delay time measurement method
In a semiconductor device manufactured in a semiconductor chip, an internal circuit generates first and second internal circuit control signals which are produced as a delay time measurement start signal and a delay time measurement stop signal, respectively, which are sent to a delay time measurement circuit. The delay time measurement circuit measures a delay time between the start and the stop signals and outputs the delay time.
Elpida Memory, Inc.
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Kenji Hiromasa
Yoshida Noda