Morrison & Foerster LLP
Semiconductor device and method of manufacturing the same
The invention enhances moisture resistance between a supporting body and an adhesive layer to enhance the reliability of a semiconductor device. A semiconductor device of the invention has a first insulation film formed on a semiconductor element, a first wiring formed on the first insulation film, a supporting body formed on the semiconductor element with an adhesive layer being interposed therebetween, a third insulation film covering the back surface of the semiconductor element onto the side surface thereof and the side surface of the adhesive layer, a second wiring connected to the first wiring and extending onto the back surface of the semiconductor element with the third insulation film being interposed therebetween, and a protection film formed on the second wiring.
Sanyo Semiconductor Co., Ltd. Sanyo Electric Co., Ltd.
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Kazuo Yoshinori Hiroshi Hiroyuki
Okada Seki Yamada Shinogi