Haynes Beffel & Wolfeld LLP
Mapping intermediate material properties to target properties to screen materials
A system for evaluating candidate materials for fabrication of integrated circuits includes a data processor coupled to a memory. Roughly described, the data processor is configured to: calculate and write to a first database, for each of a plurality of candidate materials, values for each property in a set of intermediate properties; calculate and write to a second database, values for a selected target property for various combinations of values for the intermediate properties and values describing candidate environments; and for a particular candidate material and a particular environment in combination, determine values for the intermediate properties for the candidate material by reference to the first database, and determine the value of the target property for the candidate material by querying the second database with, in combination, (1) the determined intermediate property values of the candidate material and (2) a value or values describing the particular environment.
Synopsys, Inc.
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Michael C. Terry Sylvan Kam-Chiu Yong-Seog Stephen Lee Jie Victor
Shaughnessy-Culver Ma Oh Smith Liu Moroz