Myers Bigel Sibley & Sajovec PA
Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same
A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.
Samsung Electronics Co., Ltd.
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Jae-Eung Jung-Yong Min-Gyu Young-Gu
Shim Choi Hwang Kang