Crowell & Moring LLP
Attached matter inspection device
Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.
Hitachi, Ltd.
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G01N H01J G01N G01N G01N
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Hideo Yasutaka Yuichiro Yasuaki Koichi Hisashi Masakazu
Kashima Suzuki Hashimoto Takada Terada Nagano Sugaya