Lowe Hauptman & Berner LLP
Circuit and method for detecting skew of transistor in semiconductor device
A circuit and method for easily detecting skew of a transistor within a semiconductor device are provided. The circuit for detecting the skew of the transistor includes a linear voltage generating unit for outputting a linear voltage by using a first supply voltage, a first attenuation unit for reducing variation width of the linear voltage according to the performance of the transistor, a saturation voltage generating unit for outputting a saturation voltage by using a second supply voltage, and a comparison unit for comparing an output of the first attenuation unit and the saturation voltage.
Hynix Semiconductor Inc.
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inventional inventional additional
Hwang Jun-Gi
Hur Choi