Techniques for generating bit reliability information in the post processor
A detector generates a detected sequence, and a post processor generates probability values that indicate the likelihood of a plurality of error events in the detected sequence. The post processor partitions the values into first and second subsets. The post processor selects a first most likely value from the first subset of the values and a second most likely value from the second subset of the values. The post processor generates a bit reliability based on the first and the second most likely values.
Hitachi Global Storage Technologies Netherlands, B.V.
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Richard Leo Mario Travis Roger Ksenija Zongwang Ivana Yuan Xing Bruce Alexander
Galbraith Blaum Oenning Lakovic Li Djurdjevic Lee Wilson