Volentine & Whitt, P.L.L.C.
Substrate and testing method thereof
The present invention relates to a substrate and testing method thereof. The method of the invention comprises: (a) providing a substrate, the substrate having a first surface and a second surface, the first surface having a plurality of first testing pads and the second surface having a plurality of second testing pads; (b) forming a conductive material on the first surface to electrically connect at least two first testing pads; and (c) testing the substrate by utilizing a testing fixture, the testing fixture having at least one first testing probe unit and at least one second testing probe unit. Whereby, the first testing probe unit and the second testing probe unit can easily measure the electrical characteristics of the substrate, and the testing process and testing time can be reduced.
Advanced Semiconductor Engineering, Inc.
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Chih-Chung
Chang