Renner, Otto, Boisselle & Sklar
Semiconductor device
 A semiconductor device of the present invention includes a comparator including a detection side circuit to which a detection voltage is supplied and a reference side circuit to which a reference voltage is supplied. A detection element for obtaining the detection voltage is provided inside the semiconductor device, and a reference element for obtaining the reference voltage is provided outside the semiconductor device. At least one of the detection side circuit and the reference side circuit includes a temperature dependent adjustment element for reducing a difference between a temperature characteristic of the detection voltage and a temperature characteristic of the reference voltage. 
Matsushita Electronics Corporation
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inventional inventional additional inventional inventional
Yuji Yoshiaki Yoshihiro
Yamanishi Hachiya Mori