William Park & Associates Ltd.
Semiconductor apparatuses and test system for performing burn-in test operations automatically distributed in time in response to a burn-in test command
A semiconductor apparatus in accordance with the present teachings may include an identification information register configured to store identification information for identifying a semiconductor apparatus. The semiconductor apparatus may further include an identification information decoder configured to decode the identification information and output a decoding result as a select signal. The semiconductor apparatus may also include a word line enable control circuit configured to generate a word line control signal for enabling or disabling all word lines of the semiconductor apparatus simultaneously at a predetermined time according to the select signal.
SK hynix Inc.
G G G G G G G G G
G11C G11C G11C G11C G11C G11C G11C G01R G11C
inventional inventional inventional inventional inventional additional additional inventional additional
Jung Hyun
Kim