Lowenstein Sandler LLP
Managing block retirement for temporary operational conditions
A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device identifies a behavioral criterion associated with the data loss occurrence in the block of the memory component. The processing device further increments a counter associated with the block in response to an occurrence of the behavioral criterion, wherein a value of the counter corresponds to a number of occurrences of a plurality of behavioral criteria associated with data loss occurrences in the block. Responsive to determining that the value of the counter satisfies a first threshold criterion, the processing device designates the block as a quarantined block, performs a stress test of a plurality of stress tests of the block, and responsive to the block failing a first stress test, the processing device retires the block of the memory component.
Micron Technology, Inc.
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inventional inventional inventional inventional
Christopher S. Sampath K. Kishore Kumar Kevin R. Marc S. Preston A. Scott A.
Hale Ratnam Muchherla Brandt Hamilton Thomson Stoller