Tung & Associates
Method to improve post wafer etch cleaning process
A method and apparatus for performing a semiconductor process wafer drying process, the method provides a semiconductor wafer having a process surface disposed in an enclosed drying space following exposure of the process surface to water; supplying a solvent vapor to the drying space at a predetermined concentration from a solvent vapor source and at least one solvent vapor supply line; determining at least one of a solvent vapor concentration and a solvent vapor temperature in the drying space; and heating in response to the determined solvent concentration at least one of at least a portion of one of the solvent vapor source, the at least one solvent vapor supply line, and at the drying space to alter the solvent vapor concentration in the drying space.
Taiwan Semiconductor Manufacturing Co., Ltd
H H
H01L H01L
inventional additional
Li-De Jia-Ren Chin-Chia Hann-Huei
Hsu Chen Kuo Tsai