Thermal anneal using word-line heating element
In response to detecting an event during operation of an integrated-circuit memory device containing charge-storing memory cells, an electric current is enabled to flow through a word line coupled to the charge-storing memory cells for a brief interval to heat the charge-storing memory cells to an annealing temperature range.
Rambus Inc.
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Gary B. Mark A. Mark D. Fariborz Brent S.
Bronner Horowitz Kellam Assaderaghi Haukness