Renaissance IP Law Group LLP
Semiconductor chip, test system, and method of testing the semiconductor chip
A semiconductor chip, a test system, and a method of testing the semiconductor chip. The semiconductor chip includes a pulse generator configured to generate a test pulse in response to a test request; a logic chain comprising a plurality of logic devices serially connected to each other and transferring the test pulse sequentially; and a detector configured to detect a logic level of an output signal of each of the logic devices and output a detection result indicating a degree of an inter-symbol interference (ISI).
SAMSUNG ELECTRONICS CO., LTD.
G G
G01R G01R
inventional inventional
Tae-sung Byung-hoon Seon-kyoo Jeong-don Dae-woon Sang-lok
Lee Jeong Lee Ihm Kang Kim