J.C. Patents
Method for inhibiting electromigration-induced phase segregation in solder joints
A method for inhibiting electromigration-induced phase segregation suitable for solder joint configurations used in a chip package is described as following. First, a chip package including a wiring board, a chip and numbers of solder joints is provided, wherein the chip is disposed on the wiring board, and the solder joints are disposed between the chip and the wiring board to electrically connect the chip to the wiring board. Next, a first current and a second current are alternately applied to a side of the solder joints, wherein flowing directions of the first current and the second current are opposite. The current density of the first current is 103˜105 A/cm2, and the current density of the second current is 103˜105 A/cm2.
Yuan Ze University
H H H H Y B
H05K H05K H05K H05K Y02P B23K
inventional additional additional additional additional inventional
Cheng-En Wei-Hsiang
Ho Wu