Ladas & Parry
Method for repairing memory cell
A method for repairing a memory cell having a plurality of bit lines. The memory cell is tested with a compression testing mode, and future testing is set to compression testing mode when an error is detected, or to normal testing mode when no error is detected. It is determined whether detected errors warrant repair, and all repairs deemed necessary are performed.
Nanya Technology Corporation
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inventional inventional additional
Yu-Lin Chin-Min Cheng-Cheng
Shen Chang Wu