Keating & Bennett, LLP
Test system for radio frequency IC devices and method of manufacturing radio frequency IC devices using the same
A test system for a radio frequency IC device includes a radio frequency IC chip and a radiation strip. The characteristics of the radio frequency IC device are measured by bringing the tip of a probe of a test apparatus in direct contact with a portion of the radiation strip and thereby providing a radio frequency signal. The tip of the probe is made to be a flat plate so as to obtain closer and more stable contact with the radiation strip.
Murata Manufacturing Co., Ltd.
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inventional additional additional inventional
Noboru Yuya
Kato Dokai