Cooper Legal Group, LLC
Defect diagnosis
A method for diagnosing a defect is provided. A first candidate pair comprises a first defect candidate and a second defect candidate. A first pattern is generated to distinguish one or more faults of the first defect candidate from one or more faults of the second defect candidate. The first defect candidate is removed responsive to determining that the first pattern does not detect the first defect candidate and determining that an automatic test equipment (ATE) failure log associates the first pattern with failure. Removing the first candidate pair, as well as additional candidate pairs when possible, promotes diagnosis efficiency by reducing a number of computations required.
Taiwan Semiconductor Manufacturing Company Limited
G G
G01R G01R
inventional inventional
Yen-Ling Kuen-Jong Hui-Ling Wei-Cheng Ji-Jan Cheng-Hung
Liu Lee Lin Lien Chen Wu