Haug Partners LLP
Display substrate and test method thereof
A display substrate and a test method thereof are disclosed. The display substrate includes a test wire connected to a first gate driving circuit and a second gate driving circuit; a high vertical alignment process test pad disposed on at least one side of the test wire; a first array test pad electrically connected to the first gate driving circuit and connected to the test wire to form a first connection node; a second array test pad electrically connected to the second gate driving circuit and connected to the test wire to form a second connection node; and a switch unit formed between the first connection node and the second connection node for controlling the test wire to connect or disconnect.
HKC CORPORATION LIMITED CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CORPORATION LIMITED
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Yu-jen
Chen