Haverstock & Owens LLP
Method and apparatus for built-in self-test (BIST) of integrated circuit device
An integrated circuit device (200) can include a main portion (204) and a built-in self-test (BIST) portion (204) having outputs coupled to physical input structures (e.g., bond pads) (206) of the integrated circuit device (200). A BIST portion (202) can test timing critical parameters that take into account the effect of input structures (206). A BIST portion (202) can apply BIST test signals with a pipeline structure that can emulate timing parameters, such as a set-up time (Ts) and a clock-to-output time (Tco).
Cypress Semiconductor Corporation
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G01R G01R
inventional inventional
Joseph Thinh Jun
Tzou Tran Li