Pillsbury Winthrop Shaw Pittman LLP
Passive array test structure for cross-point memory characterization
An apparatus and method for testing two-terminal memory elements organized as a cross-point memory array. The apparatus allows functional testing of two-terminal memory elements organized as a cross-point memory array, and built in a short flow manufacturing process. The proposed apparatus substantially eliminates the use of any type of additional active or passive switches, selectors, or decoders. A large number of memory elements of various memory types including planar (two dimensional) or three dimensional memory structures can be tested without the need of manufacturing selectors or running the full flow process.
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SiewHoon Rakesh Hendrik Tomasz Yuan Amit Christopher Meindert
Ng Vallishayee Schneider Brozek Yu Joag Hess Lunenborg