Marquez IP Law Office PLLC
Device comprising physical properties controlled by microstructure and method of manufacturing the same
The present invention relates to a device comprising physical properties controlled by a microstructure and a method of manufacturing the same. The present invention discloses a base layer having a patterned surface; and a two-dimensional structure layer formed on the patterned surface of the base layer, the two-dimensional structure layer extending on and in compliance to topography of the patterned surface of the base layer, such that change of physical properties of the two-dimensional structure layer conforms to the stress generated along the topography.
NATIONAL CHENG KUNG UNIVERSITY
H C B H C C
H01L C01B B82Y H01L C01B C23C
inventional inventional additional inventional inventional inventional
Tse-Ming Ching-Hao Sheng-Chin Yu-Chiang
Chen Chang Ho Hsieh