The Small Patent Law Group LLC
Systems and methods for improved component inspection
A system includes a borescope and at least one processor. The borescope includes a camera configured to acquire an acquisition series of frames of at least one target component. The at least one processor is operably coupled to the camera, and is configured to acquire the acquisition series of frames from the camera; determine a blurriness metric value for each of the frames; select frames that satisfy a threshold for the blurriness metric value to form an inspection series of frames; and perform an inspection analysis for the at least one target component using the inspection series of frames.
GENERAL ELECTRIC COMPANY
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David Scott Xiao Wei Bernard Patrick Longyin Arpit
Diwinsky Bian Wang Bewlay Wen Jain