Muir Patent Law, PLLC
Testing device, test system including the same, and method thereof
A testing device includes a signal sensing unit and a signal processing unit. The signal sensing unit generates a test output signal by sensing a signal from a device under test including a plurality of passive elements that are connected in parallel. The signal processing unit detects an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements.
SAMSUNG ELECTRONICS CO., LTD.
G G
G01R G01R
additional inventional
Yun-Cheol Min-Woo Jin-Ho Chang-Ho
Kim Kim Choi Lee