Optimized method of scanning and measuring a three-dimensional object
According to the claimed invention, a method of scanning and measuring surfaces of a three-dimensional object is disclosed. The method includes (a) scanning the object from one or more different angles with a scanning device; (b) identifying unscanned surfaces of the object that have not yet been scanned by the scanning device; (c) estimating surface areas of the unscanned surfaces; (d) comparing the surface areas of the unscanned surfaces for selecting an unscanned surface having the largest surface area; (e) rotating the object with respect to the scanning device such that the scanning device is pointing towards the unscanned surface with the largest surface area; (f) scanning the object with the scanning device for scanning the unscanned surface with the largest surface area; and (g) repeating steps (b) to (f) until all required surfaces of the object have been scanned.
BenQ Corporation
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G06T G06T
inventional additional
Wen-Kuei
Li