Davis Wright Tremaine LLP
Write operations with full sequence programming for defect management in nonvolatile memory
Data that is stored in a higher error rate format in a nonvolatile memory is backed up in a lower error rate format. Data to be stored may be transferred once to on-chip data latches where it is maintained while it is programmed in both the high error rate format and the low error rate format without being resent to the nonvolatile memory. High error rate format may be MLC format and programming in the high error rate format may program both lower page and upper page data together in a full sequence programming scheme that is suitable for handling high data volume.
SanDisk Technologies Inc.
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Pao-Ling Gautam Ashok Mrinal Jian Alexander Kwok-Tung Chris Nga Yee Seungpil
Koh Dusija Kochar Chen Mak Avila Lee