Myers Bigel, P.A.
Memory device for detecting a defective memory chip
A memory device includes a plurality of memory chips storing and outputting data in response to a control command and an address command, at least one ECC memory chip providing an error check and correction (ECC) function on the data stored and output by the plurality of the memory chips, and a controller, marking a memory chip in which a defective memory cell is detected among the plurality of memory chips, as a defective memory chip, storing data of the defective memory chip in the ECC memory chip, and controlling the defective memory chip to execute a post package repair (PPR).
SAMSUNG ELECTRONICS CO., LTD.
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Yoen Hwa Seung Hun Hui Chung
Lee Lee Byun