F. Chau & Associates, LLC
Method and equipment for testing semiconductor apparatuses simultaneously and continuously
A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.
Samsung Electronics Co., Ltd.
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G01R G01R G01R G01R
inventional inventional inventional inventional
Heon-gwon Young-jae Yun-bo Kil-yeon Eun-sik Kui-hyun
Lee Jung Yang Kim Kim Ro