JMB Davis Ben-David
Probe structure
A probe structure is provided, including two probe heads for electrically contacting with the two objects, respectively, an elastic buffer portion forming a hollow space therein, a conductive portion being disposed within the hollow space and thereby being surrounded by the elastic buffer portion, and having two ends respectively electrically being connected to the two probe heads. When the two probe heads do not contact with the two objects electrically, the conductive portion is linearly extended between the two probe heads.
CHUNGHWA PRECISION TEST TECH. CO., LTD.
G G
G01R G01R
inventional inventional
Kai Chieh Wen Tsung Chih-Peng
Hsieh Li Hsieh