Brown Rudnick LLP
Systems and methods for sample analysis
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Purdue Research Foundation
H Y H H H Y H G Y
H01J Y10T H01J H01J H01J Y10T H01J G01N Y10T
inventional additional inventional inventional inventional additional inventional additional additional
Xin Guangtao Zheng Robert Graham
Li Li Ouyang Cooks