Hauptman Ham, LLP
Method of analyzing and detecting critical cells
A method includes obtaining a feature vector for each cell in a group of cells. The feature vector for a cell includes a score value for each feature in a set of features selected for characterizing the group of cells. The method includes clustering cells in the group into a selected number of clusters, based on distances between end points of feature vectors of the cells. The method includes generating a list of ranked critical cells in the selected number of clusters based on a list of prioritized features associated with the set of features. The method includes outputting the list of ranked critical cells for use in adjusting cell layouts based on the ranked critical cells.
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
G G
G06F G06F
inventional inventional
Chih-Wei Anurag Meng-Kai
Chang Verma Hsu