Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structure
A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT) is configured to preserve the convex shape of the DUT.
Essai, Inc.
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Chee Wah Elena V. Oksana Joven R. Nasser
Ho Nazarov Kryachek Tienzo Barabi