ScienBiziP, P.C.
Method for characterizing two dimensional nanomaterial
The disclosure relates to a method for characterizing a two-dimensional nanomaterial sample. The two-dimensional nanomaterial sample is placed in a vacuum chamber. An electron beam passes through the two-dimensional nanomaterial sample to form a diffraction electron beam and a transmission electron beam to form an image on an imaging device. An angle θ between the diffraction electron beam and the transmission electron is obtained. A lattice period d of the two-dimensional nanomaterial sample is calculated according to a formula d sin θ≅dθ=λ, where λ represents a wavelength of the electron beam.
HON HAI PRECISION INDUSTRY CO., LTD. Tsinghua University
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Xiao-Yang Chun-Hai Kai-Li Wei Peng Duan-Liang Shou-Shan
Lin Zhang Jiang Zhao Liu Zhou Fan