Williams, Morgan & Amerson, P.C.
Compensating for layout dimension effects in semiconductor device modeling
A method includes receiving design data associated with an integrated circuit device. The integrated circuit device includes a first element having a corner defined therein and a second element overlapping the first element. A dimension specified for the first element in the design data is adjusted based on a distance between the second element and the corner. The integrated circuit device is simulated based on the adjusted dimension.
Advanced Micro Devices, Inc.
G
G06F
inventional
Jian Mark W. Akif Jingrong R.
Chen Michael Sultan Zhou