Apparatus and method for testing and debugging an integrated circuit
An interface that communicates with first and second interface modules, an analyzer and an integrated circuit comprises a first path from the first and second interface modules and the analyzer to the integrated circuit. The first path includes a first serializer that serializes at least one of first control data and/or test data from at least one of the first and/or second interface modules. A second path from the integrated circuit to the first and second interface modules and the analyzer includes a high speed deserializer that deserializes serial data containing at least one of test result data and/or second control data from the integrated circuit. A frame sync module synchronizes data from the high speed deserializer to identify frames. The high speed deserializer outputs the second control data to at least one of the first and/or second interface modules. The frame sync module outputs the frames to the analyzer.
Marvell International Ltd.
G G G
G01R G01R G06F
additional inventional inventional
Daniel Saeed Son
Smathers Azimi Ho