Muir Patent Law, PLLC
Probe and probe card including the same
A probe includes a beam and at least two tips. The beam transmits test signals to a device under test (DUT). The at least two tips are arranged on a first end portion of the beam in a direction at a predetermined angle to a length direction of the beam and contacts adjacent terminals of the DUT. The beam has a larger width that exceeds a sum of widths of the at least two tips in a width direction of the beam such that the probe has an improved current carrying capacity and is prevented from being damaged due to overcurrent.
SAMSUNG ELECTRONICS CO., LTD.
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Gyu-Yeol Yu-Kyum Jae-Won
Kim Kim Kim