Contactor with angled depressible probes
A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the spring probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force.
ESSAI, INC.
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G01R G01R
additional inventional
Nasser Chee-Wah Oksana
Barabi Ho Kryachek