Arent Fox LLP.
Semiconductor device with mechanism for leak defect detection
A semiconductor device includes a plurality of signal terminals, a first power supply terminal, a second power supply terminal, a core circuit coupled to the plurality of signal terminals and the first power supply terminal, a plurality of first transistors coupled between the respective signal terminals and the second power supply terminal, and a plurality of second transistors coupled between the respective signal terminals and a ground potential, wherein the core circuit is configured to make the first transistors conductive and nonconductive alternately and make the second transistors nonconductive and conductive alternately at a time of test operation, such that one of a first transistor and a second transistor being conductive with respect to a given signal terminal requires another one of the first transistor and the second transistor to be nonconductive with respect to the given signal terminal.
Fujitsu Limited
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Hitoaki Hiroyoshi Yuji
Nishiwaki Yamashita Kurita