Apparatus and method for testing and debugging an integrated circuit
A system is provided that retrieves test information from a target integrated circuit. A serializer receives the test information in a first format and divides and reformats the test information into first and second serial messages. The serializer is located on the target integrated circuit and has a first serial output that sends the first serial message and a second serial output that sends the second serial message. A deserializer communicates with the first and second serial outputs and receives the first and second serial messages. The deserializer retrieves a first portion of the test information from the first serial message, a second portion of the test information from the second serial message, and reconstructs the test information from the first portion and the second portion.
Marvell International Ltd.
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G01R G06F G01R G01R
inventional inventional inventional inventional
Daniel Saeed Son
Smathers Azimi Ho