Sughrue Mion, PLLC
Apparatus and method of measuring integrity
Provided are an apparatus and method of measuring integrity, in which unnecessary memory loading of an object for measuring integrity is avoided. The apparatus includes a mapping module loading at least one second object, among a plurality of second objects divided from a first object in accordance with an allocation unit of a memory, into the memory, a memory module storing a hash value of the divided second object, and a measurement module measuring integrity of the first object by comparing a hash value of the loaded at least one second object with the hash value stored in the memory module.
Samsung Electronics Co., Ltd.
H
H04L
inventional
Hyun-jin Myung-june Kyung-im
Choi Jung Jung