JCIPRNET
Profile measuring method, profile measuring apparatus, and deformation detecting apparatus
A profile measuring method used to measure a profile of an object-under-test includes the following steps. A light source, a light-transmissive projection film, and an image capturing device are provided, where the light-transmissive projection film is located between the light source and the image capturing device. The object-under-test is placed between the light source and the light-transmissive projection film, and a light beam is provided toward the light-transmissive projection film by the light source, to form an object-under-test projection of the object-under-test on the light-transmissive projection film. An image of the object-under-test projection is captured by the image capturing device, to obtain a projection size of the object-under-test projection. A measuring size of the object-under-test is calculated according to the projection size of the object-under-test projection. In addition, a profile measuring apparatus and a deformation detecting apparatus are also provided.
UTECHZONE CO., LTD.
G G G G
G01B G06T G06T G01B
inventional inventional additional inventional
Yueh-Long Po-Tsung
Lee Lin