Antistatic mask for use with electronic test apparatus
 A laminated antistatic electrical test mask for use with bed-of-nails test equipment in analyzing electrical properties between locations on a circuit board or card wherein the mask material prevents unused probes from contacting the product to be tested. The mask includes a plurality of layers comprised alternatively of cured glass cloth and a hygroscopic material, with a plurality of apertures disposed through the mask for receipt of test probes. In a particular embodiment, the layers are comprised of prepreg and a cellulose-containing material such as bonded paper. Electrostatic charges are more evenly distributed throughout the multiple layers of the composition to reduce charge densities presented to the test probes thereby significantly reducing destruction of JFETs associated with the probes from electrostatic discharge therethrough. 
International Business Machines Corporation
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Gerry W. Padmanabhan Harold F.
Moore Dhanakoti Smith