System and device for automatic signal measurement
The system for automatic signal measurement includes a device under test, a control circuit, a data processing circuit, and a display device. The device under test includes a test pad area, which has multiple exposed test pads coupled to multiple circuit nodes in the device under test. The control circuit is coupled to the exposed test pads through a clamping fixture. The control circuit receives multiple test signals from the exposed test pads, stores multiple test signals in the memory, and controls a power on/off operation applied to the device under test through the exposed test pads. The data processing circuit is configured to receive the test signals stored in the memory, and determine whether the test signals meet a set of predetermined criteria to generate a verification result. The display device displays a signal waveform of the test signals and the verification result.
DFI Inc.
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Chia-yi
Chang