F. Chau & Associates, LLC
System and method of testing a semiconductor device and method of fabricating the semiconductor device
A semiconductor device test system may include a body providing an internal space, in which a test device is loaded, and a cover coupled to the body to cover the internal space. The cover may include a first cover including first openings two-dimensionally arranged and a second cover including second openings two-dimensionally arranged. An arrangement of the first openings may be different from an arrangement of the second openings.
SAMSUNG ELECTRONICS CO., LTD.
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Junbae Yongho
Kim Cho