Hogan Lovells US LLP
Device for determining aim position of charged particle beam, method of using the device, and treatment device employing device for determining aim position
A subject is imaged for treatment of the subject such as an eye to be inspected, while irradiating a charged particle beam on the eye, so that an aim position of a charged particle beam for treatment can be determined.The device for determining an aim position of a charged particle beam includes a range adjuster 14 that adjusts an irradiation position, in a depth direction of the eye, of a charged particle beam irradiated from a charged particle beam source, a mirror 18 that transmits or passes the position determining charged particle beam and reflects an emitted light emitted from a region of the eye on which the charged particle beam is irradiated and an emitted light emitted, due to an irradiated of an excitation light, from a region including the region of the eye on which the position determining charged particle beam, toward the outside of the axis of the charged particle beam, and an eyeground imaging device 24 that is arranged at a position where the emitted lights reflected from the mirror are incident and images the region including the region of the eye on which the charged particle beam is irradiated by causing the emitted lights to be incident, so that it allows to determine an aim position of a charged particle beam for treatment based on a imaged image.
Japan Atomic Energy Agency National University Corporation Gunma University
A A A A A
A61B A61N A61N A61B A61N
inventional additional inventional inventional inventional
Masakazu Takuro Yasushi Takashi Shoji Mitsuhiro Takahiro Kazuo Ken Hiroyuki Hirofumi Takashi Taku
Oikawa Sakai Horiuchi Nakano Kishi Fukuda Satoh Arakawa Yusa Katoh Shimada Agematsu Sato