Baker & McKenzie LLP
Data error measuring circuit for semiconductor memory apparatus
A data error measuring circuit for a semiconductor memory apparatus includes a data error correction unit that compares data with parity data to correct data, a data selection unit that outputs the data or the corrected data as selected data in response to a test selection signal, and a test result output unit that receives the selected data and the parity data to output a test result signal in response to the test selection signal.
SK hynix Inc.
G
G06F
inventional
Seong-Seop
Lee