Brooks Kushman P.C.
Inspection device and inspection method for array substrate
An inspection device includes: a driving circuit, configured to input display data of an image to a pixel electrode of the array substrate; a light-emitting device comprising a first electrode, a second electrode, and a plurality of light-emitting units arranged between the first electrode and the second electrode, and the plurality of light-emitting units is capable of emitting light under the effect of an electric field between the first electrode and the second electrode; a test circuit, configured to electrically connect the first electrode of the light-emitting device to the pixel electrode of the array substrate, and input a first electrical signal to the second electrode of the light-emitting device, to generate the electric field; and a processing circuit, configured to acquire optical information of the light emitted by the light-emitting device, and determine whether there is an electrical defect in the array substrate according to the optical information.
BOE TECHNOLOGY GROUP CO., LTD. HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
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Guangyao Bo Xuehai Jun Liangchen Dongfang Qinghe
Li Mao Gui Wang Yan Wang Wang