Muir Patent Consulting, PLLC
Apparatus for measuring IQ imbalance
The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.
GCT Semiconductor, Inc.
H H
H04L H04L
inventional inventional
Joonbae Jeong Woo Kyeongho Seung-Wook Eal Wan
Park Lee Lee Lee Lee