IC with test structures and e-beam pads embedded within a contiguous standard cell area
An IC that includes a contiguous standard cell area with a 4×3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.
PDF Solutions, Inc.
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Marcin Stephen Markus Marci Sherry Jonathan Matthew Andrzej Indranil Hideki Tomasz John Larg Rakesh Vyacheslav Nobuharu Kimon Dennis Sheng-Che Timothy Christopher Hans Simone Conor Kelvin Carl Jeremy
Strojwas Lam Rauscher Liao Lee Haigh Moe Strojwas De Matsuhashi Brozek Kibarian Weiland Vallishayee Rovner Yokoyama Michaels Ciplickas Lin Fiscus Hess Eisenmann Comensoli O'Sullivan Doong Taylor Cheng