F. Chau & Associates, LLC
Smart card and method of testing smart card
A smart card includes a non-volatile memory, a CPU, and a plurality of pads. The non-volatile memory stores a test program. The CPU is released from a reset state in response to a test enable signal. The CPU executes the test program stored in the non-volatile memory based on predetermined flag information and stores a result of the test program in the non-volatile memory.
Samsung Electronics Co., Ltd.
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Seung-Won
Lee