Test engine for integrated circuit chip testing
Some of the embodiments of the present disclosure provide an integrated circuit (IC) chip comprising a die, a system on chip (SOC) coupled to the die, and an internal test engine included in the SOC and configured to test the die, wherein one or more components within the IC chip may be configured to be tested by an external test engine coupled to the IC chip. Other embodiments are also described and claimed.
Marvell International Ltd.
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Abdul Albert Chiping Hungchi Bruce
Elaydi Wu Ai Chen Wang