Haynes Beffel & Wolfeld LLP
Characterizing target material properties based on properties of similar materials
Roughly described, a technique for approximating a target property of a target material is provided. For each material in a plurality of anchor materials, a correspondence is provided between the value for a predetermined index property of the material and a value for the target property of the material, the values of all the index properties being different. A predictor function is identified in dependence upon the correspondence. A computer system determines a value for the target property for the target material in dependence upon the predictor function and a value for the index property for the target material. The determined value for the target property for the target material is reported to a user. The correspondence can be provided in a database on a non-transitory computer readable medium. The correspondence can be determined experimentally or analytically for each material in a plurality of anchor materials.
SYNOPSYS, INC.
H G
H04L G06F
inventional inventional
Terry Sylvan Kam-Chiu Jie Yong-Seog Stephen Lee Victor Michael C.
Ma Liu Oh Smith Moroz Shaughnessy-Culver