IP & T Group LLP
Comparing twice-read memory cell data for error detection in a memory device
A memory device may include a plurality of memory cells; an error detection unit suitable for: latching data read a first time from at least one selected memory cell of the plurality of memory cells in a detection period, comparing data read a second time from the at least one selected memory cell with the latched data, and detecting an error of the at least one selected memory cell in the detection when the date read a second time from the at least one substantially the same with the latched data.
SK Hynix Inc.
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Jae-Il Jun-Gi Tae-Kyun Min-Su
Kim Choi Kim Park