Brinks Hofer Gilson & Lione
Semiconductor wafer testing system
A semiconductor wafer testing system tests one or more die clusters on a semiconductor wafer, using a test circuit to test multiple sections or areas of each die in parallel. The semiconductor wafer testing system has a buffer connected to the die cluster via the test circuit. The buffer writes test data onto a section of each die in the die cluster. The buffer reads test data from the section of each die in the die cluster.
Infineon Technologies North America Corporation
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inventional inventional additional
James J. Daivid Suitwai George W.
Dietz Ma Alexander