Myers Bigel Sibley & Sajovec, P.A.
Methods of forming integrated circuit chips having vertically extended through-substrate vias therein
Methods of forming an integrated circuit device include forming an interlayer dielectric layer on a first surface of a semiconductor substrate and then forming an interconnect hole that extends through the interlayer dielectric layer and into the semiconductor substrate. A first sidewall spacer layer is formed on a sidewall of the interconnect hole. The semiconductor substrate at a bottom of the interconnect hole is isotropically etched to define an undercut recess in the semiconductor substrate. This etching step is performed using the first sidewall spacer layer as an etching mask. The interconnect hole and the uncut recess are then filled with a through-via electrode. A second surface of the semiconductor substrate is removed for a sufficient duration to expose the uncut recess containing the through-via electrode.
Samsung Electronics Co., Ltd.
H H H H H H H H H H H H H H H H
H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L H01L
additional additional additional inventional additional inventional inventional inventional additional inventional additional additional additional inventional additional additional
Ju-il Son-Kwan Ho-Jin Myeong-Soon Kang-Wook
Choi Hwang Lee Park Lee