Stevens Law Group
Test circuit board adapted to be used on memory slot
A test circuit board adapted to be used on memory slot is provided. Each memory slot of a board to be tested is connected to one test circuit board. A plurality of the test circuit boards form an in-series connection therebetween. A test access port (TAP) controller is connected electrically to the board to be tested and one of the test circuit boards so that the memory slots, which are connected to the test circuit boards, may be tested at the same time.
INVENTEC (PUDONG) TECHNOLOGY CORPORATION INVENTEC CORPORATION
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Xiao Qian Ping Chang Qing
Li Song Mu