Semiconductor integrated device and gate screening test method of the same
To provide a semiconductor integrated device capable of a gate screening test with no need for any additional circuit and without adding any gate screening terminal. The semiconductor integrated device includes a gate drive unit configured to drive the gate of a voltage controlled semiconductor element and a regulator configured to supply a gate drive voltage to the gate drive unit. The regulator includes an external connection terminal capable of receiving a gate screening voltage for the voltage controlled semiconductor element in a gate screening test.
FUJI ELECTRIC CO., LTD.
G G G H
G01R G01R G05F H03K
inventional additional inventional inventional
Wataru Masahiro Takahiro Masaru Hitoshi Akira Osamu
Tomita Sasaki Mori Saito Sumida Nakamori Sasaki