Kenyon & Kenyon
Dual-chamber gas sampling device
 The present invention relates to an improved gas sampling device comprising a pair of hollow rectangular chambers having diffusion apertures, a heat insulating plate, a reflecting element, a light source and a light detector; wherein the pair of rectangular chambers are arranged one over the other, with the heat insulating element being placed therebetween, the reflecting element having two reflecting surfaces at right angle with respect to each other, one end of the rectangular chambers being secured to the reflecting element with each end thereof being aligned with a reflecting surface, the light source and the light detector being placed at the other end respectively of the rectangular chambers. In use, the rectangular chambers are placed horizontally with the light source being in the lower chamber such that when light is emitted from the light source, light rays pass through the lower chamber and are reflected by the reflecting surface to enter into the upper chamber and, finally, received by the light detector. The concentration of the gas can be measured by analyzing the variation in intensity resulted from the specific wavelength of the infrared light absorbed in the chambers by the gas to be measured. With the light source being packed in a metal, gas sampling rate is increased with the gas flowing into the upper chamber by the convection due to the higher temperature in the lower chamber than that in the upper chamber when light is emitted. 
Industrial Technology Research Institute
G G
G01N G01N
inventional inventional
Jack Yung Hsin Yao Min
Chen Chen Lin