Generating root cause candidates for yield analysis
Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
Mentor Graphics Corporation
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additional inventional inventional
Robert Brady Jonathan J. Wu-Tung Christopher Chen-Yi
Benware Muirhead Cheng Schuermyer Chang