Foley & Lardner
Design rule check method
 A design rule check is to inspect whether mask pattern data of a semiconductor integrated circuit is correctly designed in accordance with a design standard or not. A design rule check method of the present invention is characterized in that design rule check errors occurring in the design rule check between a first error and a second error output in accordance with whether the design rule check errors overlap or not. 
NEC Corporation
G
G06F
inventional
Kyou
Suzuki