Ladas & Parry LLP
Substrate with test circuit
The present invention relates to a substrate with a substrate test circuit. In an embodiment, by making the length of the wiring from a first data-line-test input terminal to a first panel equal to that of the wiring from a second data-line-test input terminal to the first panel, the input resistances between two test input terminals of a first data-line-test line and the first panel are identical, and thus when a data line of the first panel is detected, the voltage drops of test signals inputted from the two test input terminals are the same, and the test signals actually loaded to the first panel are the same and the detecting abilities are identical.
Beijing BOE Optoelectronics Technology Co., Ltd.
G
G09G
inventional
Hua Yu Yupeng Haoran
Liu Lu Chen Gao