Westman, Champlin & Koehler, P.A.
Apparatuses and methods for measuring a clearance
The present disclosure provides an apparatus and method for measuring a clearance. The apparatus comprises: a first measurement component configured to be mounted on a first object in a mounted state thereof, so that a first measurement surface of the first measurement component is aligned with a first surface to be measured of the first object; and a second measurement component configured to be mounted on a second object in a mounted state thereof, so that a second measurement surface of the second measurement component is aligned with a second surface to be measured of the second object, wherein the first measurement component comprises a measurement instrument configured to measure a first distance between the measurement instrument and the first measurement surface and a second distance between the measurement instrument and the second measurement surface, wherein the clearance is calculated based on the first distance and the second distance.
BEIJING BOE DISPLAY TECHNOLOGY CO., LTD. BOE TECHNOLOGY GROUP CO., LTD.
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Feng Xiaoran Quanyue Xianglong Changkai
He Duan Li Li Zhao