Birch, Stewart, Kolasch & Birch LLP
Semiconductor device and method for detecting needle mark shifting
A semiconductor device is provided. The semiconductor device includes a first test pad and a plurality of second test pads. The first test pad includes a central portion and a plurality of peripheral portions. The plurality of peripheral portions are disposed adjacent to edges of the central portion. The plurality of peripheral portions are not in contact with each other and with the central portion. The first test pad has a plurality of detection directions, and at least one of the plurality of peripheral portions is disposed in one of the plurality of detection directions. Each of the plurality of second test pads is electrically connected to one of the plurality of peripheral portions through a first connection trace.
WINBOND ELECTRONICS CORP.
G G G G G
G01R G01R G01R G01R G01R
inventional inventional inventional inventional inventional
Ming-Huan Jian-Sheng Ming-Hung
Hsieh Chen Lai